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Path: Home>News & Events>Conferences>2012

See below major events with CAMECA participation in 2012. 

Geographical listing, click on a region: Americas - Asia Pacific - Europe, Middle East, Africa

Americas

ASLO 2012 
2012 Ocian Sciences Meeting
CAMECA Instruments, Inc. booth
Salt Lake City, UT
USA
Feb
20-24
TMS 2012 
141st Annual Meeting & Exhibition
2 invited talks on Atom Probe Tomography
Orlando, FL
USA
March 
11-15
43rd LPSC 
Lunar & Planetary Science Conference
CAMECA Instruments, Inc. booth
Thursday evening preseantion on our booth: "New Advances in Atom Probe Technologies & SXFive New Generation EPMA"
The Woodlands, TX
USA
March
19-23
MRS Spring Meeting
2 invited talks on Atom Probe Tomography & NanoSIMS
S. Francisco, CA
USA
April
9-13
24th Annual Workshop on SIMS
CAMECA Instruments, Inc. booth
Philadelphia, PA
USA
May
14-18
IFES Atom Probe
53rd International Field Emission Symposium
CAMECA Instruments, Inc. booth
Tuscaloosa, AL
USA
May
21-25
GACMAC 2012
Geological Assoc° / Mineralogical Assoc° of Canada: Joint Meeting
CAMECA Instruments, Inc. booth
St Johns, NK
Canada
May
27-29 
AMC 2012
6th Advanced Materials Characterization Workshop
CAMECA Instruments, Inc. sponsorship - tabletop
Champaign, IL
USA
June
6-7
Surface Analysis 2012
CAMECA Instruments, Inc. table top
Richland, WA
USA
June
19-22
Goldschmidt 2012
CAMECA Instruments, Inc. booth
Montreal
Canada
June
24-29
M&M 2012
Microscopy & Microanalysis Meeting
CAMECA Instruments, Inc. booth
Phoenix, AZ
USA
Jul 29
Aug 2
Geoanalysis 2012
8th triennial meeting of the International Association of Geoanalysts
CAMECA booth
Buzios, RJ
Brasil
Sep
16-20
XI Encontro da SBPMat
Annual Meeting of the Brazilian Materials Research Society
CAMECA booth
Florianopolis, SC
Brasil
Sep
23-27
46° CGB
Congress of the Brazilian Society of Geologia
CAMECA booth
Santos, SP
Brasil
Sep 30
Oct 5
59th AVS Int'l Symposium & Exhibit
CAMECA Instruments, booth
Tampa, FL
USA
Oct 28
Nov 2
AGU Fall Meeting 2012
CAMECA Instruments, booth
S. Francisco, CA
USA
Dec
6-10 

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Asia-Pacific

ACMM 22
22nd Australian Conference on Microscopy and Microanalysis
CAMECA booth
Perth
Australia
Feb
5-9
Semicon Korea 2012
CAMECA Korea booth
Seoul
Korea
Feb
7-9
Symposium on New Technology & Methodology in Isotope Geology
CAMECA China booth
Xiamen
China
April
20-23
Korean Society of Microscopy
CAMECA Korea booth
Korea May
24-25 
SISS-14
International Symposium on SIMS and Related Techniques
CAMECA Japan sponsorship
Seikei
Japan
May 31
June 1
EMSI 2012
Annual Meeting of the Electron Microscopy Soviety of India
CAMECA India sponsorship

Invited talk: Evolution and Capabilities of 3D Atom Probe Tomography
Bangalore
India
July
2-4
China Materials Research Society 2012
CAMECA China booth
Taiyuan
China
July
13-18 
Meteoritical Society 2012
75th Annual Meeting

CAMECA booth
Cairns
Australia
August
12-17
KSMS Meeting 2012
Korean Society for Mass Spectrometry
CAMECA Korea booth
Gyeongju
Korean
Aug
22-24
JASIS 2012
Japan Analytical Scientific Instruments Show
CAMECA Japan booth
Chiba-city
Japan
Sep
5-7
Geochemical Society of Japan
Annual Meeting 2012
CAMECA Japan booth
Fukuoka City
Japan
Sep
11-13 
Korean Surface Science Symposium
CAMECA Korea booth

Oral: Applications of NanoSIMS in Life Sciences
Boryeong, Chungnam
Korea
Oct
10-12
IWN2012
International Workshop on Nitride Semiconductors
CAMECA Japan booth

Sapporo
Japan
Oct
14-19
CCATM 2012
Int'l Conf. & Exhib. on Analysis, Testing, of Metallurgical Process & Materials
CAMECA China booth
Beijing
China
Oct 31
Nov 3
National Symposium on Petrology and Geodynamics
CAMECA China booth
China Oct
LSI Testing 2012
CAMECA Japan booth
Toyonaka, Osaka
Japan
Nov
7-9
MRS-Taiwan
CAMECA Taiwan booth
Formosa Univ.
Taiwan
Nov
23-24

SSSJ 2012
Symposium of the Surface Science Sty of Japan
CAMECA Japan booth

Kobe City, Hyogo
Japan
Nov
30

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Europe, Middle East, Africa

XIV EMPG
Experimental Mineralogy Petrology & Geochemistry
CAMECA Germany booth
Kiel
Germany
March
4-7
EMBO
Workshop on Microbial Sulfur Metabolism
CAMECA Germany booth
Noordwijkerhout
Netherlands
April
15-18
EGU 2012
European Geosciences Union General Assembly
CAMECA Germany booth
Oral
: Tools for advanced Element and Isotope Analysis in Geoscience
Vienna
Austria
April
22-27
E-MRS Spring
European Materials Research Society
CAMECA booth #36
Strasbourg
France
May
15-17
FFM 2012
Caractérisation des Surfaces, de l'échelle nanométrique aux applications industrielles
Posters presentations:  IMS 7f; Atom Probe...
Grenoble
France
June
5-7
SCANDEM
Nordic Microscopy Society Conference
CAMECA booth
Bergen
Norway
June
12-15
EMAS - 10th Regional Workshop
CAMECA booth
Padova
Italy
June
17-20
Silicon  2012
CAMECA booth

Invited talk: Characterization of Si-SiGe Heterostructures using Dynamic SIMS & APT
St Petersburg
Russia
June
9-13 
ISGN 4
4th Int'l Conf. on Growth of III-Nitrides
CAMECA booth

Oral: APT Characterization of InGaN Device Structures
Poster: Characterization of Nitrides based LED Materials Using Dynamic SIMS
St Petersburg
Russia
June
16-19
Ultrapath XVI
Conf. on Diagnostic Electron Microscopy, Basic Research & Oncology
CAMECA Germany booth
Regensburg
Germany
August
6-10
ISME 14
International Symposium on Microbial Ecology
CAMECA booth
Copenhagen
Denmark
August
19-24
European Mineralogical Conference 2012
CAMECA Germany booth
Frankfurt
Germany
Sep
2-6
JESIUM 2012
Joint European Stable Isotope Users group Meeting
CAMECA Germany booth
Leipzig
Germany
Sep
2-7
European SIMS Workshop
CAMECA Germany booth
Muenster
Germany
Sep
9-11 
IWZnO 2012 
7th Int'l Workshop on Zinc Oxide and Related Materials
CAMECA booth
Poster: SIMS analytical technique for characterizing ZnO-based materials
Nice
France
Sep
11-14
EMC 2012 
15th European Microscopy Congress
Acutance/CAMECA booth
Manchester
UK
Sep
16-21
E-MRS Fall Meeting
European Materials Research Society
Comef booth
Warsaw
Poland
Sep
11-21
GN-MEBA 2012
French Sty for Scanning Electron Microscopy & Microanalysis
CAMECA booth
Paris
France
Dec
6-7
MSSA 2012
Microscopy Society of Southern Africa Annual Conference
Wirsam Scientific booth
South Africa Dec
Workshops & Users' Meetings

Lab course NanoSIMS in biogeochemistry
(organized by TU Munchen)
24-28 November, Freising, Germany

4th Australian Atom Probe Microscopy Workshop
(organized by The University of Sidney/ACMM)
24-25 November, Sydney, Australia

6th School on Atom Probe Tomography
(organized by GPM - Université de Rouen)
27-31 October, Rouen, France

NanoSIMS International Workshop
13-14 October, Paris, France

1st South African Electron Probe MicroAnalysis Workshop
(co-organized with Wirsam)
27-28 August, Johannesburg, South Africa

Workshop on Nano Probe Techniques
(co-organized with IIT Delhi & MRS India)
14th July, New Delhi, India

French speaking SIMS users’ meeting
(organized by Institut Jean Lamour & CRPG)
2-3 June, Nancy, France

Indian user meeting
19-22 May, Goa, India

1st South-American Workshop on EPMA
23-24 April, Porto Alegre, Brazil


Recent and submitted CAMECA contributions, a selection:

Lanthanum quantification for optimization of advanced high-k/metal gate stacks using low energy electron X-ray emission spectrometry*
(Poster, AVS, Baltimore, MD, USA, Nov 2014)

Correlative Compositional Analysis of Fiber Optic Nanoparticles*
(Poster & oral, IMC, Prague, Czech Republic, Sep 2014)

Improvements of isotopic ratio reproducibility using EMs, and O- primary beam performance on the NanoSIMS 50L
(Poster, SIMS Europe, Münster, Germany, Sep 2014)

Extremely low impact energy SIMS characterization of graphene*
(Poster, Graphene Week, Gothenburg, Sweden, June 2014)

Characterization of Arsenic PIII Implants in finFET by LEXES & SIMS*
(Oral, IIT, Portland, USA, June 2014)

Implantation & metrology solutions for low energy Boron implant on 450mm wafers*
(Oral, IIT, Portland, USA, June 2014)


New Applications of LEAP Microscopy from Analysis of Quantum Dots to Zircon Crystal Dating*
(Poster, ECASIA, Cagliari, Italy, Oct 13)

New CAMECA IMS 7f-Auto: high throughput & automation*
(Poster, SIMS Int'l Korea, Sep 13)

Quantitative analysis with the CAMECA SXFiveFe at high lateral resolution. Applications to Geochronology & Mineralogy*
(Poster, Goldschmidt, Florence, Italy, Aug 13)

Recent in situ geochronology studies with the CAMECA ion microprobe*
(Poster, William Smith, London, UK, June 13)

Quantitative & reproducible analysis with the CAMECA SXFiveFe at high lateral resolution*
(Poster, EMAS, Porto, Portugal, May 13)

Shallow Probe: non-destructive compositional metrology for films and structures*
(Poster, Frontiers, Gaithersburg, MD, USA, Mar 13)

SIMS analytical technique for characterizing ZnO-based materials*
(Poster, IWZnO, Nice, France, Sep 12)

Quantitative And Repeatable Analysis At High Spatial Resolution With Field Emission Electron MicroProbe*
(Poster, M&M, Phoenix, AZ, USA, July 2012)

Atom Probe Tomography Analysis of Grain Boundaries in CdTe*
(M&M, Phoenix, AZ, USA, July 2012)

Characterization of Si-SiGe Heterostrucrures using SIMS & APT*
(Oral, Silicon 2012, St Petersburg, Russia, June 12)

Characterization of Nitride-based LED materials using dynamic SIMS*
(Poster, ISGN 4, St Petersburg, Russia, June 12)

High precision 4-isotope Sulfur measurements using the CAMECA IMS 1280-HR*
(Poster, Goldschmidt, Montreal, Canada, June 2012)

Atomic Scale Imaging of U, Th & radiogenic Pb in Zircon*
(Oral, Goldschmidt, Montreal, Canada, June 2012)

Nuclear Safeguards applications using LG-SIMS with automated screening capabilities*
(Oral, SIMS Workshop, Philadelphia, USA, May 2012)

Atom Probe Tomography Analysis of Photovoltaic CdTe*
(Poster, IFES, Univ. of Alabama, USA, April 2012)

Coupling identity and metabolic function of single cells in environmental microbiology with NanoSIMS*
(Poster, EMBO, Noordwijkerhout, Netherlands, April 2012)

The Use of LEXES to Measure the Chemical Composition of In-situ Doped Epitaxial SiGe for High Performance CMOS Technology*
(Poster, Frontiers, Grenoble, France, May 2011)


*on request only. Please write to cameca.info@ametek.com

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