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AMETEK Materials Analysis Division
CAMECA at the International Conference SIMS XXI in Krakow, Poland

Sep 10-15, 2017:  CAMECA was one of the main sponsors of the 21st International Conference on Secondary Ion Mass Spectrometry in Krakow, Poland.

Several of our product managers and sales leaders made the trip and presented recent technological and application developments for the CAMECA SIMS product line.

Nearly 100 of our SIMS instruments users attended CAMECA traditional user reception on tuesday evening at Café Oranzeria, and enjoyed the view over Krakow.


Find below the presentations by our product managers. Don't hesitate to contact us if you could not attend and would like more information.

Dr. Paula Peres,
"Dynamic SIMS for Materials Analysis in Nuclear Science." 
Oral: Monday 11, 17:40, (Session 3 - OA2)

Dr. Alexander Merkulov,
"Quantitative low energy depth profiling of p- and n-doped SiGe laterally non-uniform structures."
Oral: Tuesday 12, 15:00, (Session 2 - SN2)

Dr. Paula Peres,
"CAMECA IMS 1300-HR³: The New Generation Ion Microprobe."
Poster session: Tuesday 12, 18:00-20:00, (OA1 - P41)
Dr. Alexander Merkulov,
"Quantitative low energy depth profiling of semiconductor and semi-isolating structures using Optical Conductivity Enhancement."
Poster session: Tuesday 12, 18:00-20:00, (SN2 - P37)




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