Dr. Katherine Rice of CAMECA Instruments, Inc. in Madison, WI has been selected to receive a 2017 MML Distinguished Associates Accolade from the National Institute for Standards and Technology (NIST) for helping to develop a transmission electron backscatter diffraction (TEM-EBSD) technique that provides a 10-fold improvement of measurement of the atomic structure of crystalline materials compared to traditional means.
This breakthrough will revolutionize the characterization of vital materials for advanced electronics, nanotechnologies, and innovative structural alloys. The MML Accolades Program was created to recognize exemplary work in areas of strategic interest and benefit to NIST. Dr. Rice will be presented with the award at the MML Accolades Gala on June 6, 2017 at the NIST facility in Boulder, CO.
Several papers have already been published:
Specimen-thickness effects on transmission Kikuchi patterns in the scanning electron microscope, K.P. Rice, R.R. Keller, M.P. Stoykovich, Journal of Microscopy. 254 (2014) 129–136. doi:10.1111/jmi.12124.
Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography, K.P. Rice, Y. Chen, T.J. Prosa, D.J. Larson, Microscopy and Microanalysis. 22 (2016) 583–588. doi:10.1017/S1431927616011296.