CAMECA Logo
Worldwide contacts - Service & Support
Search


Home
AMETEK Materials Analysis Division
Workshop on Nano Probe Techniques at IIT Kanpur, India
IIT KanpurThe Indian Institute of Technology in Kanpur and CAMECA invite to a one day Workshop on Nano Probe Techniques, April 10th, 2015.

The workshop aims to provide basic and advanced knowledge of Secondary Ion Mass Spectroscopy (SIMS) and Atom Probe Tomography (APT) and their applications.

The technical talks by eminent experts on SIMS will cover the depth profile, 2D & 3D, isotopic ratio and mass spectrum analytical outputs. The technical talks on APT will cover the extensive capabilities of the technique for both 3D imaging and chemical composition at the atomic scale.

Invited speakers Atom Probe Technology Session:
  • Dr. Peter Clifton, CAMECA - USA
  • Dr. Anirudh Biswas, BARC-Mumbai
  • Prof. B. S. Murty, Department of Metallurgical and Materials Engineering, IIT-Madras
  • Prof. Balamurli Krishnan, Scientist F & Head, SSG Defence Metallurgical Research Laboratory, Kanchanbagh, Hyderabad
  • Dr. R. Gopalan, Head Centre for Automotive Energy Materials, International Advanced research, Centre for Powder metallurgy and New Materials (ARCI), Chennai
Invited speakers Secondary Ion Mass Spectrometry Session:
  • Dr. Philippe Saliot - CAMECA - France
  • Dr. A. K. Tyagi, Head surface and Nano Science Division, Materials, Science Group. IGCAR.
  • Dr. AnuradhaDhaul, Group-Characterization Div, SSPL-New Delhi
  • Dr. J. N. Goswam, and Dr. Kuljeet Kaur Marhas, Physical Research Laboratory (PRL), Ahmedabd

Research scholars and young faculty members working in the area of Physics, Chemistry, Materials Science, Earth Science, and Engineering are eligible to participate in this workshop. Registration until 10th March 2015, by email to Dr. Sri Sivakumar. Venue: PBCEC, Indian Institute of Technology Kanpur, Kanpur-208016.

EVENTS

NEWS

instruments for research - metrology tools - applications - user publications - news - conferences - company - locations

Atom Probe Tomography (APT) - SIMS - EPMA - LEXES - ICP-MS - GD-MS - TIMS

© 2010-2016 AMETEK, Inc - CAMECA SAS. All Rights Reserved - www.ametek.com
privacy - trademarks - sitemap