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  • Analysis of Off-the-Shelf Semiconductor Devices
    Webinar: Analysis of Off-the-Shelf Semiconductor Devices

    Tuesday, March 17, 2026 15 days ago

    This webinar demonstrates how atom probe tomography provides quantitative, three‑dimensional insights into off‑the‑shelf semiconductor devices, supporting failure analysis, benchmarking, and advanced device characterization.

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  • Magnetically Confined and Atom Probe Defined: how APT helps to solve the fusion materials challenge
    Webinar: Magnetically Confined and Atom Probe Defined: How APT Helps to Solve the Fusion Materials Challenge

    Wednesday, February 18, 2026 42 days ago

    Discover how magnetic confinement enhances atom probe tomography performance by improving ion trajectory stability, mass resolution, and quantitative 3D nanoscale analysis across complex materials.

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  • Matrix effet and mineral characterisation for LG-SIMS by Laure Martin
    Webinar: Matrix effects and mineral characterization on LG-SIMS

    Tuesday, February 10, 2026 50 days ago

    Laure Martin (UWA) presented the fundamentals and challenges of matrix effects on LG‑SIMS, illustrated with examples from the lab and literature, and provided practical strategies to improve quantification accuracy and data reliability in SIMS analysis.

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  • Dr. Niculina Musat webinar
    Webinar: Imaging Microbial Life at the Nanoscale: How NanoSIMS Reveals Single-Cell Function

    Wednesday, February 4, 2026 56 days ago

    A special webinar celebrated the International Day of Women and Girls in Science. Dr. Niculina Musat showcased how NanoSIMS reveals single‑cell microbial activity within complex communities, highlighting key methods, recent advances, and real‑world case studies.

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  • Unlocking New Mechanisms in Laser-Assisted Field Evaporation of Oxides – Application note
    Unlocking New Mechanisms in Laser-Assisted Field Evaporation of Oxides – Application note

    Tuesday, January 27, 2026 64 days ago

    New Application Note: "Unlocking New Mechanisms in Laser-Assisted Field Evaporation of Oxides" uncovers a novel laser‑assisted evaporation mechanism in oxides, enabled by deep‑UV illumination and LEAP® 6000 XR technology.

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  • Webinar: Atom Probe Characterization of Multi-Layer Ceramic Capacitors
    Webinar: Atom Probe Characterization of Multi-Layer Ceramic Capacitors

    Friday, January 23, 2026 68 days ago

    Explore how atom probe tomography uncovers nanoscale chemistry in MLCCs—from core–shell architecture to grain boundary segregation and Ni–ceramic interfaces—using the latest CAMECA innovations.

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  • Facility Opening & Inaugural Symposium
    Invizo 6000 inauguration at National University of Singapore

    Wednesday, January 21, 2026 70 days ago

    National University of Singapore (NUS) Unveils First Invizo 6000 Atom Probe Facility in ASEAN, Marking a Major Leap in 3D Atomic‑Scale Materials Analysis

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  • Analysis of Hydrogen in Semiconductor Materials application note
    Analysis of Hydrogen in Semiconductor Materials – Application note

    Monday, January 19, 2026 72 days ago

    Discover how CAMECA’s IMS 7f-Auto delivers unmatched SIMS sensitivity for hydrogen depth profiling in silicon and GaAs. Ensure measurement accuracy, traceability, and ISO compliance for semiconductor innovation.

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